Evaluation of interfacial misfit strain field of heterostructures using STEM nano secondary moiré method

Yao Zhao, Yang Yang, Huihui Wen, Chao Liu, Xianfu Huang*, Zhanwei Liu*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Evaluation of interfacial misfit strain field of heterostructures using STEM nano secondary moiré method'. Together they form a unique fingerprint.

Engineering