Dual-wavelength Fourier ptychographic microscopy for topographic measurement

Engineering

• High Resolution 100%
• Demonstrates 33%
• Computer Simulation 33%
• Scattered Field 33%
• Microstructure 33%
• Phase Retrieval 33%
• Microscale 33%
• Total Variation 33%
• Regularization 33%
• Lateral Resolution 33%
• Cutting Edge 33%
• Atomic Force Microscopy 33%
• High Aspect Ratio 33%
• Laser Wavelength 33%
• Measurement Range 33%
• Blazed Grating 33%

Earth and Planetary Sciences

• High Aspect Ratio 33%
• Atomic Force Microscopy 33%

Physics

• Atomic Force Microscopy 33%