Defect Modeling During the SLM Process for Manufacturing Microwave Devices

Shuai Li^*, Xiue Bao^*, Giovanni Gugliandolo, Haoyun Yuan^*, Jinkai Li, Linxiang Shao^*, Minghe Du, Nicola Donato, Zlatica Marinkovic, Giovanni Crupi, Lili Fang^*, Liming Si^*, Houjun Sun^*

^*Corresponding author for this work

School of Integrated Circuits and Electronics

Beijing Institute of Technology
Tangshan Research Institute BIT
University of Messina
University of Nis

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Defect Modeling During the SLM Process for Manufacturing Microwave Devices

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