Defect and deformation comprehensive measurement method based on dual-wavelength speckles

Tianshuang Han, Yao Hu*, Xi Xu, Qun Hao

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Fingerprint

Dive into the research topics of 'Defect and deformation comprehensive measurement method based on dual-wavelength speckles'. Together they form a unique fingerprint.

Material Science