Abstract
A new two-step technique was developed to fabricate a composite probe for a Scanning Tunneling Microscopy (STM). The first step was to form a flat area on the W(100) surface of several hundred square nanometers or less in an area at the end of a single crystalline tungsten tip. The second step consisted of epitaxial growth of a nanoparticle on this flat area by molecular beam epitaxy. Both atomic resolution imaging on the MoO2/Mo(110) surface covered with Fe nanoclusters and magnetic contrast on Fe nanoclusters were obtained at T = 78 K as an indication of an excellent performance and stability of the composite STM probe. The developed technique of composite probes formation is very promising for the fabrication of probes with the required physical characteristics.
Original language | English |
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Article number | 235301 |
Journal | Journal of Applied Physics |
Volume | 122 |
Issue number | 23 |
DOIs | |
Publication status | Published - 21 Dec 2017 |
Externally published | Yes |