Color speckle deflectometry for three-dimensional surface transient measurement

Zichen Wang, Yao Hu*, Qun Hao, Chuheng Xu, Yuan Heng Liu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Transient measurement technology has broad application prospects in fields such as mirror processing, automotive painting, and precision mechanical processing. It can help us monitor and analyze instantaneous changes in the processing process in real-time. The existing contact and non-contact measurement methods have drawbacks in both non-destructive testing and transient measurement directions. This paper develops a transient measurement system for color speckle deflectometry, aiming to improve efficiency in the field of optical measurement. The core components of the system described in this paper include a liquid crystal display (LCD) screen, a camera, and a beam splitter. By using multi-channel speckle fusion and color correction, one color image is captured to achieve the same effect as the previous three monochromatic images. The gradient of each point on the surface under test (SUT) is obtained through speckle shift, and then the surface shape of the SUT is obtained through integration. The feasibility is verified by the actual measurement with a flat mirror. By utilizing these devices and methods, transient measurement of the three-dimensional shape of a mirror can be achieved, and reliable results can be obtained in both laboratory environments and processing sites. Compared with traditional measurement methods, this system not only has a significant improvement in measurement speed, but also can achieve non-destructive and in place measurement.

Original languageEnglish
Title of host publicationOptical Design and Testing XIII
EditorsYongtian Wang, Tina E. Kidger, Rengmao Wu
PublisherSPIE
ISBN (Electronic)9781510667792
DOIs
Publication statusPublished - 2023
EventOptical Design and Testing XIII 2023 - Beijing, China
Duration: 14 Oct 202315 Oct 2023

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12765
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Design and Testing XIII 2023
Country/TerritoryChina
CityBeijing
Period14/10/2315/10/23

Keywords

  • Coaxial system
  • Color speckle
  • Speckle deflectometry
  • Surface shape measurement
  • Transient measurement

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