Bondable Copper Substrates with Silver Solid Solution Coatings for High-Power Electronic Applications

Yongjun Huo, Chin C. Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Recently, silver solid solution phase with indium, (Ag)-xxIn, has been demonstrated to be one of potential candidates of metallic packaging material for future high-power electronics bonding and interconnection applications due to its great anti-tarnishing property and superior mechanical properties, such as high ductility and high ultimate tensile strength. To further explore and utilize its great potential for electronic packaging applications, the authors have studied the methodology in fabricating silver solid solution thin film layer on copper substrates as its coating layer, using E-beam evaporation deposition. The grazing incidence X-ray diffraction (GIXRD) and X-ray photoelectron spectra (XPS) were used in couple to study the surface composition and thin film quality of the silver-indium solid solution layer on copper substrates. High quality homogenous coating layers with various compositions have been successfully fabricated on copper substrates. It is worthwhile noticing that additional annealing steps are not needed to achieve the homogenous silver-indium solid solution layers. Subsequent solid-state bonding experiments have shown the good bondability of the resulting coating layer of silver-indium solid solution with their cross-sectional optical and scanning electron microscope (SEM) images. Accordingly, the resulting copper substrates with silver-indium solid solution coatings should have a great potential to be used as a highly conductive bondable substrate for high-power electronics and photonics applications.

Original languageEnglish
Title of host publicationProceedings - IEEE 67th Electronic Components and Technology Conference, ECTC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages166-172
Number of pages7
ISBN (Electronic)9781509043323
DOIs
Publication statusPublished - 1 Aug 2017
Externally publishedYes
Event67th IEEE Electronic Components and Technology Conference, ECTC 2017 - Lake Buena Vista, United States
Duration: 30 May 20172 Jun 2017

Publication series

NameProceedings - Electronic Components and Technology Conference
ISSN (Print)0569-5503

Conference

Conference67th IEEE Electronic Components and Technology Conference, ECTC 2017
Country/TerritoryUnited States
CityLake Buena Vista
Period30/05/172/06/17

Keywords

  • Electronic packaging
  • Grazing incidence X-ray diffraction
  • Silver-indium solid solution
  • Solid-state bonding
  • X-ray photoelectron spectra

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