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An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes
Jian Chen, Le Yang*, Yu Han, Yin Hua Bao, Kai Lun Zhang, Xiang Li, Jing Pang, Hao Sen Chen, Wei Li Song, Yu Jie Wei, Dai Ning Fang
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
18
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(Scopus)