A method for compensating the polarization aberration of projection optics in immersion lithography

Yue Jia, Yanqiu Li*, Lihui Liu, Chunying Han, Xiaolin Liu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Citations (Scopus)

Abstract

As the numerical aperture (NA) of 193nm immersion lithography projection optics (PO) increasing, polarization aberration (PA) leads to image quality degradation seriously. PA induced by large incident angle of light, film coatings and intrinsic birefringence of lens materials cannot be ignored. An effective method for PA compensation is to adjust lens position in PO. However, this method is complicated. Therefore, in this paper, an easy and feasible PA compensation method is proposed: for ArF lithographic PO with hyper NA (NA=1.2), which is designed by our laboratory, the PA-induced critical dimension error (CDE) can be effectively reduced by optimizing illumination source partial coherent factor σout. In addition, the basic idea of our method to suppress pattern placement error (PE) is to adopt anti-reflection (AR) multi-layers MgF2/LaF3/MgF2 and calcium fluoride CaF2 of [111] crystal axes. Our simulation results reveal that the proposed method can effectively and quantificationally compensate large PA in the optics. In particular, our method suppresses the dynamic range of CDE from -12.7nm ∼ +4.3nm to -1.1nm ∼ +1.2nm, while keeping PE at an acceptable level.

Original languageEnglish
Title of host publication7th International Symposium on Advanced Optical Manufacturing and Testing Technologies
Subtitle of host publicationDesign Manufacturing, and Testing of Micro- and Nano-Optical Devices, and Systems
EditorsA.G. Poleshchuk, Tianchun Ye, Song Hu
PublisherSPIE
ISBN (Electronic)9781628413588
DOIs
Publication statusPublished - 2014
Event7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design Manufacturing, and Testing of Micro- and Nano-Optical Devices, and Systems, AOMATT 2014 - Harbin, China
Duration: 26 Apr 201429 Apr 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9283
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design Manufacturing, and Testing of Micro- and Nano-Optical Devices, and Systems, AOMATT 2014
Country/TerritoryChina
CityHarbin
Period26/04/1429/04/14

Keywords

  • birefringence
  • immersion lithography
  • polarization aberration
  • projection optics

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