Fingerprint
Dive into the research topics of 'A failure-dependence related stochastic crack growth modeling approach of competing cracking mode'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
A failure-dependence related stochastic crack growth modeling approach of competing cracking mode
Shuowen Wang, Wei Li*, Chuanwen Sun, Gang Liu, Asif Mahmood, Zhenduo Sun
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review