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Jie Ding

Calculated based on number of publications stored in Pure and citations from Scopus
20132024

Research activity per year

  • 19 Article
  • 10 Conference contribution
  • 2 Conference article
  • 2 Review article
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Conference contribution

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  • 2019

    Advanced simulation of rram memory cells

    Sadi, T., Badami, O., Georgiev, V., Ding, J. & Asenov, A., Oct 2019, Proceedings - 2019 IEEE 13th International Conference on ASIC, ASICON 2019. Ye, F. & Tang, T.-A. (eds.). IEEE Computer Society, 8983467. (Proceedings of International Conference on ASIC).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • Multiscale modeling of charge trapping in molecule based flash memories

    Badami, O., Sadi, T., Georgiev, V., Adamu-Lema, F., Thirunavukkarasu, V., Ding, J. & Asenov, A., Sept 2019, Proceedings of 2019 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2019. Driussi, F. (ed.). Institute of Electrical and Electronics Engineers Inc., 8870518. (International Conference on Simulation of Semiconductor Processes and Devices, SISPAD; vol. 2019-September).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    2 Citations (Scopus)

  • Physical Insights into the Transport Properties of RRAMs Based on Transition Metal Oxides

    Sadi, T., Badami, O., Georgiev, V., Ding, J. & Asenov, A., Sept 2019, Proceedings of 2019 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2019. Driussi, F. (ed.). Institute of Electrical and Electronics Engineers Inc., 8870391. (International Conference on Simulation of Semiconductor Processes and Devices, SISPAD; vol. 2019-September).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    2 Citations (Scopus)
  • 2017

    Variable selection based on random vector functional-link in soft sensor modeling

    Wen, X., Ding, J. & Yan, G., 13 Feb 2017, Proceedings - 2016 9th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2016. Institute of Electrical and Electronics Engineers Inc., p. 1339-1343 5 p. 7852924. (Proceedings - 2016 9th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2016).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • 2015

    Reliability aware simulation flow: From TCAD calibration to circuit level analysis

    Hussin, R., Gerrer, L., Ding, J., Amaroso, S. M., Wang, L., Semicic, M., Weckx, P., Franco, J., Vanderheyden, A., Vanhaeren, D., Horiguchi, N., Kaczer, B. & Asenov, A., 5 Oct 2015, 2015 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2015. Institute of Electrical and Electronics Engineers Inc., p. 152-155 4 p. 7292281. (International Conference on Simulation of Semiconductor Processes and Devices, SISPAD; vol. 2015-October).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    6 Citations (Scopus)

  • Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow

    Hussin, R., Gerrer, L., Ding, J., Wang, L., Amoroso, S. M., Cheng, B., Reid, D., Weckx, P., Simicic, M., Franco, J., Vanderheyden, A., Vanhaeren, D., Horiguchi, N., Kaczer, B. & Asenov, A., 10 Nov 2015, ESSDERC 2015 - Proceedings of the 45th European Solid-State Device Research Conference. Grasser, T., Pribyl, W. & Schrems, M. (eds.). Editions Frontieres, p. 238-241 4 p. 7324758. (European Solid-State Device Research Conference; vol. 2015-November).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Citation (Scopus)

  • Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits

    Asenov, A., Ding, J., Reid, D., Asenov, P., Amoroso, S., Adamu-Lema, F. & Gerrer, L., 27 Jul 2015, 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015. Institute of Electrical and Electronics Engineers Inc., p. 2449-2452 4 p. 7169180. (Proceedings - IEEE International Symposium on Circuits and Systems; vol. 2015-July).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    8 Citations (Scopus)
  • 2013

    An accurate compact modelling approach for statistical ageing and reliability

    Ding, J., Reid, D., Millar, C. & Asenov, A., 2013, 2013 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2013. p. 57-60 4 p. 6650573. (International Conference on Simulation of Semiconductor Processes and Devices, SISPAD).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    6 Citations (Scopus)

  • Interplay between statistical reliability and variability: A comprehensive transistor-to-circuit simulation technology

    Gerrer, L., Amoroso, S. M., Asenov, P., Ding, J., Cheng, B., Adamu-Lema, F., Markov, S., Asenov, A., Reid, D., Millar, C. & Asenov, A., 2013, 2013 IEEE International Reliability Physics Symposium, IRPS 2013. p. 3A.2.1-3A.2.5 6531972. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    18 Citations (Scopus)

  • Investigation of SRAM using BTI-aware statistical compact models

    Ding, J., Reid, D., Millar, C. & Asenov, A., 2013, ESSDERC 2013 - Proceedings of the 43rd European Solid-State Device Research Conference. IEEE Computer Society, p. 186-189 4 p. 6818850. (European Solid-State Device Research Conference).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    2 Citations (Scopus)