Weak infrared radiation intensity measurement based on extended Duffing oscillator

Yongming Zhao, Jian Du, Xin Wang*, Chang Liu, Zhuo Li, Yan Hao

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

1 引用 (Scopus)

摘要

Measurement of infrared radiation with low intensity in level of 10-6 W / cm2 is difficult. Because both background and the components used in the measurement system will generate infrared radiation, which results in a low signal-to-noise ratio (SNR). Except of using photodetector with high sensitivity, weak signal processing method is crucial. In this paper an infrared radiation intensity measurement setup based on intercomparison method is introduced. A reflective chopper is used to modulate the detected infrared radiation. By using a MCT Detector with Dewar the infrared signal is transferred to electric signal. To process the weak modulated signal with strong noise an extended Duffing oscillator is introduced. Both amplitude and phase of the modulation signal with known frequency is obtained by step-time-delay technique (equivalent to phase shifting in frequency-domain). The measurement error can be maintained below 16.1% even when the SNR is as low as -67 dB. The corresponding received infrared radiation power is only 1.05×10-9 W. The proposed signal processing method shows superior ability and great potential applications compared with commonly used method, such as lock-in amplification.

源语言英语
主期刊名AOPC 2021
主期刊副标题Infrared Device and Infrared Technology
编辑HaiMei Gong, Zelin Shi, Jin Lu
出版商SPIE
ISBN(电子版)9781510649972
DOI
出版状态已出版 - 2021
活动2021 Applied Optics and Photonics China: Infrared Device and Infrared Technology, AOPC 2021 - Beijing, 中国
期限: 20 6月 202122 6月 2021

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
12061
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2021 Applied Optics and Photonics China: Infrared Device and Infrared Technology, AOPC 2021
国家/地区中国
Beijing
时期20/06/2122/06/21

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