Weak infrared radiation intensity measurement based on extended Duffing oscillator

Yongming Zhao, Jian Du, Xin Wang*, Chang Liu, Zhuo Li, Yan Hao

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

Measurement of infrared radiation with low intensity in level of 10-6 W / cm2 is difficult. Because both background and the components used in the measurement system will generate infrared radiation, which results in a low signal-to-noise ratio (SNR). Except of using photodetector with high sensitivity, weak signal processing method is crucial. In this paper an infrared radiation intensity measurement setup based on intercomparison method is introduced. A reflective chopper is used to modulate the detected infrared radiation. By using a MCT Detector with Dewar the infrared signal is transferred to electric signal. To process the weak modulated signal with strong noise an extended Duffing oscillator is introduced. Both amplitude and phase of the modulation signal with known frequency is obtained by step-time-delay technique (equivalent to phase shifting in frequency-domain). The measurement error can be maintained below 16.1% even when the SNR is as low as -67 dB. The corresponding received infrared radiation power is only 1.05×10-9 W. The proposed signal processing method shows superior ability and great potential applications compared with commonly used method, such as lock-in amplification.

Original languageEnglish
Title of host publicationAOPC 2021
Subtitle of host publicationInfrared Device and Infrared Technology
EditorsHaiMei Gong, Zelin Shi, Jin Lu
PublisherSPIE
ISBN (Electronic)9781510649972
DOIs
Publication statusPublished - 2021
Event2021 Applied Optics and Photonics China: Infrared Device and Infrared Technology, AOPC 2021 - Beijing, China
Duration: 20 Jun 202122 Jun 2021

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12061
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference2021 Applied Optics and Photonics China: Infrared Device and Infrared Technology, AOPC 2021
Country/TerritoryChina
CityBeijing
Period20/06/2122/06/21

Keywords

  • Duffing oscillator
  • Low signal-to-noise ratio (SNR)
  • Weak infrared radiation
  • Weak signal detection

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