The Effects of Annealing Atmosphere on Dual Gate Dielectric ITO TFTs

Guangchen Zhang, Zhinong Yu, Junchen Dong, Qi Li, Yi Wang, Dedong Han

科研成果: 期刊稿件会议文章同行评审

摘要

The effects of annealing atmosphere (Vacuum, Air, N2, and O2) on performance of dual high-k gate dielectrics ITO TFTs are studied. The ITO TFTs annealed in N2 show excellent electrical properties, including a saturation mobility of 18.0 cm2V-1s-1, a subthreshold swing of 215.4 mV/decade, and an on-to-off state current ratio of 1.79 × 109. This work drives the application of ITO TFTs in the field of electronics devices.

源语言英语
页(从-至)600-602
页数3
期刊Digest of Technical Papers - SID International Symposium
53
S1
DOI
出版状态已出版 - 2022
活动International Conference on Display Technology, ICDT 2022 - Fuzhou, 中国
期限: 9 7月 202212 7月 2022

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Zhang, G., Yu, Z., Dong, J., Li, Q., Wang, Y., & Han, D. (2022). The Effects of Annealing Atmosphere on Dual Gate Dielectric ITO TFTs. Digest of Technical Papers - SID International Symposium, 53(S1), 600-602. https://doi.org/10.1002/sdtp.16036