摘要
The effects of annealing atmosphere (Vacuum, Air, N2, and O2) on performance of dual high-k gate dielectrics ITO TFTs are studied. The ITO TFTs annealed in N2 show excellent electrical properties, including a saturation mobility of 18.0 cm2V-1s-1, a subthreshold swing of 215.4 mV/decade, and an on-to-off state current ratio of 1.79 × 109. This work drives the application of ITO TFTs in the field of electronics devices.
源语言 | 英语 |
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页(从-至) | 600-602 |
页数 | 3 |
期刊 | Digest of Technical Papers - SID International Symposium |
卷 | 53 |
期 | S1 |
DOI | |
出版状态 | 已出版 - 2022 |
活动 | International Conference on Display Technology, ICDT 2022 - Fuzhou, 中国 期限: 9 7月 2022 → 12 7月 2022 |
指纹
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Zhang, G., Yu, Z., Dong, J., Li, Q., Wang, Y., & Han, D. (2022). The Effects of Annealing Atmosphere on Dual Gate Dielectric ITO TFTs. Digest of Technical Papers - SID International Symposium, 53(S1), 600-602. https://doi.org/10.1002/sdtp.16036