The adhesion failure analysis of the MEMS gyroscope with comb capacitor

X. J. Liang, S. Q. Gao

科研成果: 书/报告/会议事项章节会议稿件同行评审

4 引用 (Scopus)

摘要

The MEMS gyroscope has wide application foreground, the reliability of MEMS gyroscope is a key problem for its commercial application. With the development of the MEMS gyroscope industrialization, the reliability is underway to meet the need of market. In this paper, the adhesion failure modes of MEMS gyroscope is presented. In addition, the adhesion failure analysis is illustrated. Finally, a lateral comb capacitor structure to improve the reliability of the MEMS gyroscope is presented, the reliability of the lateral comb capacitor is discussed. The lateral comb capacitor structure is valuable for the optimize design of the other types of gyroscopes.

源语言英语
主期刊名Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009
1234-1236
页数3
DOI
出版状态已出版 - 2009
活动2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009 - Chengdu, 中国
期限: 20 7月 200924 7月 2009

出版系列

姓名Proceedings of 2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009

会议

会议2009 8th International Conference on Reliability, Maintainability and Safety, ICRMS 2009
国家/地区中国
Chengdu
时期20/07/0924/07/09

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