TY - JOUR
T1 - Structural and optical properties of Cu–N codoped ZnO thin films deposited by magnetron cosputtering
AU - Liu, Haonan
AU - Ran, Yujing
AU - Jia, Liuwei
AU - Lu, Huiping
AU - Zhao, Shujun
AU - Zhao, Hongkang
AU - Li, Yinglan
AU - Jiang, Zhaotan
AU - Wang, Zhi
N1 - Publisher Copyright:
© 2018, Springer Science+Business Media, LLC, part of Springer Nature.
PY - 2018/6/1
Y1 - 2018/6/1
N2 - ZnO films codoped by copper and nitrogen were prepared by magnetron cosputtering. The effects of this codoping on the structural and optical properties of ZnO films were systematically studied. The results show that Cu–N codoping didn’t affect the optimal orientation. Cu–N codoping can enlarge the grain size, enhance the crystallinity, reduce the stress and lead to denser and smoother surface. A significant red shift of absorption edge and gap-narrowing effect resulting from codoping were found in ZnO films. Cu-doping, N-doping, and oxygen vacancy are the main factors leading to property modification of the ZnO films. By Cu–N codoping, we can modulate the microstructure and optical properties of ZnO films in a wider range.
AB - ZnO films codoped by copper and nitrogen were prepared by magnetron cosputtering. The effects of this codoping on the structural and optical properties of ZnO films were systematically studied. The results show that Cu–N codoping didn’t affect the optimal orientation. Cu–N codoping can enlarge the grain size, enhance the crystallinity, reduce the stress and lead to denser and smoother surface. A significant red shift of absorption edge and gap-narrowing effect resulting from codoping were found in ZnO films. Cu-doping, N-doping, and oxygen vacancy are the main factors leading to property modification of the ZnO films. By Cu–N codoping, we can modulate the microstructure and optical properties of ZnO films in a wider range.
UR - http://www.scopus.com/inward/record.url?scp=85045058664&partnerID=8YFLogxK
U2 - 10.1007/s10854-018-9032-1
DO - 10.1007/s10854-018-9032-1
M3 - Article
AN - SCOPUS:85045058664
SN - 0957-4522
VL - 29
SP - 9901
EP - 9907
JO - Journal of Materials Science: Materials in Electronics
JF - Journal of Materials Science: Materials in Electronics
IS - 12
ER -