摘要
The plasma kinematical equation is used in study of the mechanism of partial discharge through the particle-in-cell method (PIC) simulation of the gas discharge along the insulator surface in SF6/N2 gas mixtures. Through the 2-D poisson equation, the finite element (FEM) method is used to solve the electric field, and leap-frog method is adopted to track the movement of particles and the Monte Carlo model (MCM) is applied to simulate the process of particle collision. The simulation of dynamic discharge process in the environment of two-dimensional SF6/N2 mixed-gas is achieved, which includes ionization, attachment, recombination and photoionization. In this paper, through computer simulation of charged particles by the force build-up to the insulator surface, the development process is demonstrated. It's great significance to study the mechanism of surface charge accumulation and its impact on the gas discharge along the insulator surface in SF6/N2 gas mixtures.
源语言 | 英语 |
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页(从-至) | 220-226 |
页数 | 7 |
期刊 | Diangong Jishu Xuebao/Transactions of China Electrotechnical Society |
卷 | 26 |
期 | 8 |
出版状态 | 已出版 - 8月 2011 |
已对外发布 | 是 |