TY - JOUR
T1 - Research on calibration method of three band infrared integrated radiometer
AU - Wang, Xia
AU - Gao, Zhi Yun
AU - Zhang, Jianyong
AU - Jin, Weiqi
N1 - Publisher Copyright:
© 2002 SPIE.
PY - 2002/9/20
Y1 - 2002/9/20
N2 - A three band infrared integrated radiometer was developed for field measurement. The composition and work theory of the radiometer are described in this paper. The detailed calibration methods are analyzed for extended source and point source, and corresponding measurement results are given. With test data, the experimental results and instrument performance are analyzed in detail, in respect of the equivalent temperature of inter reference blackbody, linearity with target temperature, measurement error of point source and extended source. To lessen the influents of calibration for measurement, the attentive problems in actual calibration of extended source and point source are summarized, and satisfied results are acquired.
AB - A three band infrared integrated radiometer was developed for field measurement. The composition and work theory of the radiometer are described in this paper. The detailed calibration methods are analyzed for extended source and point source, and corresponding measurement results are given. With test data, the experimental results and instrument performance are analyzed in detail, in respect of the equivalent temperature of inter reference blackbody, linearity with target temperature, measurement error of point source and extended source. To lessen the influents of calibration for measurement, the attentive problems in actual calibration of extended source and point source are summarized, and satisfied results are acquired.
KW - Calibration
KW - Infrared
KW - Integrated radiometer
UR - http://www.scopus.com/inward/record.url?scp=0347498393&partnerID=8YFLogxK
U2 - 10.1117/12.471417
DO - 10.1117/12.471417
M3 - Conference article
AN - SCOPUS:0347498393
SN - 0277-786X
VL - 4927
SP - 133
EP - 138
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
T2 - Optical Design and Testing 2002
Y2 - 14 October 2002 through 18 October 2002
ER -