PI-TSV等效热导率提取与验证

Ying Tao Ding, Ming Rui Zhou, Zhi Qiang Cheng, Lei Xiao

科研成果: 期刊稿件文章同行评审

摘要

Compared with the traditional T/R modules, the 2.5D integrated silicon-based T/R modules implemented with TSV interposer are smaller, more integrated and possess better heat dissipation. Through-silicon-via (TSV) is one of the key structures. It is difficult to realize the finite element thermal simulation of complicated 2.5D integrated T/R modules, thus a solution which utilizes the equivalent thermal conductivity of TSV was employed to simplify the finite element analysis (finite element analysis, FEA) in this paper. The FEA of TSV with polymide liner (PI-TSV) was carried out and the structural parameters were changed to detect their effects on PI-TSV equivalent thermal conductivity. Finally, the empirical equation of PI-TSV equivalent thermal conductivity with respect to copper pillar diameter, insulation thickness and TSV pitch was presented.

投稿的翻译标题Extraction and Verification on Equivalent Thermal Conductivity of PI-TSV
源语言繁体中文
页(从-至)1180-1186
页数7
期刊Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology
39
11
DOI
出版状态已出版 - 1 11月 2019

关键词

  • Equivalent thermal conductivity
  • Finite element analysis
  • T/R module
  • Through-silicon-via

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