摘要
Compared with the traditional T/R modules, the 2.5D integrated silicon-based T/R modules implemented with TSV interposer are smaller, more integrated and possess better heat dissipation. Through-silicon-via (TSV) is one of the key structures. It is difficult to realize the finite element thermal simulation of complicated 2.5D integrated T/R modules, thus a solution which utilizes the equivalent thermal conductivity of TSV was employed to simplify the finite element analysis (finite element analysis, FEA) in this paper. The FEA of TSV with polymide liner (PI-TSV) was carried out and the structural parameters were changed to detect their effects on PI-TSV equivalent thermal conductivity. Finally, the empirical equation of PI-TSV equivalent thermal conductivity with respect to copper pillar diameter, insulation thickness and TSV pitch was presented.
投稿的翻译标题 | Extraction and Verification on Equivalent Thermal Conductivity of PI-TSV |
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源语言 | 繁体中文 |
页(从-至) | 1180-1186 |
页数 | 7 |
期刊 | Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology |
卷 | 39 |
期 | 11 |
DOI | |
出版状态 | 已出版 - 1 11月 2019 |
关键词
- Equivalent thermal conductivity
- Finite element analysis
- T/R module
- Through-silicon-via