Partial Triple Modular Redundancy Method for Fault-Tolerant Circuit based on HITS Algorithm

Yu Xie*, Wen Yue Yu, Ning Zhang, He Chen, Yi Zhuang Xie

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

1 引用 (Scopus)

摘要

Circuits related to nuclear facilities and on-orbit circuits typically require fault-tolerant reinforcement to cope with harsh radiation environments. While the traditional fully Triple Modular Redundancy (TMR) method can effectively reinforce circuits, it suffers from the problems of large circuit area and high power consumption. To solve this problem, this paper proposes a Partial TMR method based on the HITS algorithm (Hyperlink-Induced Topic Search), which can effectively perform circuit fault tolerance. This method sorts the importance of triggers in the circuit based on the HITS algorithm and uses the Fault Interval Time (MTBF) of the Bi-Logic Cone model as the judgment criterion to determine the number of triggers that need to be redundantly designed under partial TMR. Some commonly used modules of an on-orbit processor were tested to verify the effectiveness of the proposed redundancy method in this paper. The experimental results show that the resource overhead can be reduced by at least 20% while achieving an MTBF of 99.9% under TMR.

源语言英语
主期刊名36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023
编辑Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9798350315004
DOI
出版状态已出版 - 2023
活动36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023 - Juan-Les-Pins, 法国
期限: 3 10月 20235 10月 2023

出版系列

姓名Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT
ISSN(印刷版)2576-1501
ISSN(电子版)2765-933X

会议

会议36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023
国家/地区法国
Juan-Les-Pins
时期3/10/235/10/23

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