TY - JOUR
T1 - Modulation transfer function measurement of electron multiplying CCD
AU - Feng, Zhiwei
AU - Cheng, Haobo
AU - Song, Qian
AU - Shang, Yuanyuan
PY - 2008/9
Y1 - 2008/9
N2 - Based on the Fourier power spectrum theory, a measurement method by means of a random white-noise pattern transparent target was presented to analyze the effect of electron multiplication (EM) on the modulation transfer function (MTF) of electron multiplying charge-coupled device (EMCCD). By building an integrated system model of EMCCD, the multiplication MTFs at different multiplication gain were measured and discussed in experiments. The experimental results show that the electron multiplication process significantly influences the system MTF, compared with non-EM, especially at high EM gain. MTF declines by an average of about 30% at Nyquist frequency. The MTF and noise of auxiliary imaging optical system and the method of focusing judgment in experiment were also discussed.
AB - Based on the Fourier power spectrum theory, a measurement method by means of a random white-noise pattern transparent target was presented to analyze the effect of electron multiplication (EM) on the modulation transfer function (MTF) of electron multiplying charge-coupled device (EMCCD). By building an integrated system model of EMCCD, the multiplication MTFs at different multiplication gain were measured and discussed in experiments. The experimental results show that the electron multiplication process significantly influences the system MTF, compared with non-EM, especially at high EM gain. MTF declines by an average of about 30% at Nyquist frequency. The MTF and noise of auxiliary imaging optical system and the method of focusing judgment in experiment were also discussed.
KW - Electron multiplying CCD
KW - Modulation transfer function
KW - Optical measurement
KW - Random white-noise target
UR - http://www.scopus.com/inward/record.url?scp=53649101823&partnerID=8YFLogxK
U2 - 10.3788/AOS20082809.1710
DO - 10.3788/AOS20082809.1710
M3 - Article
AN - SCOPUS:53649101823
SN - 0253-2239
VL - 28
SP - 1710
EP - 1716
JO - Guangxue Xuebao/Acta Optica Sinica
JF - Guangxue Xuebao/Acta Optica Sinica
IS - 9
ER -