Modulation transfer function measurement of electron multiplying CCD

Zhiwei Feng; Haobo Cheng; Qian Song; Yuanyuan Shang

doi:10.3788/AOS20082809.1710

Modulation transfer function measurement of electron multiplying CCD

Zhiwei Feng^*, Haobo Cheng, Qian Song, Yuanyuan Shang

^*Corresponding author for this work

School of Optics and Photonics

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

Based on the Fourier power spectrum theory, a measurement method by means of a random white-noise pattern transparent target was presented to analyze the effect of electron multiplication (EM) on the modulation transfer function (MTF) of electron multiplying charge-coupled device (EMCCD). By building an integrated system model of EMCCD, the multiplication MTFs at different multiplication gain were measured and discussed in experiments. The experimental results show that the electron multiplication process significantly influences the system MTF, compared with non-EM, especially at high EM gain. MTF declines by an average of about 30% at Nyquist frequency. The MTF and noise of auxiliary imaging optical system and the method of focusing judgment in experiment were also discussed.

Original language	English
Pages (from-to)	1710-1716
Number of pages	7
Journal	Guangxue Xuebao/Acta Optica Sinica
Volume	28
Issue number	9
DOIs	https://doi.org/10.3788/AOS20082809.1710
Publication status	Published - Sept 2008

Keywords

Electron multiplying CCD
Modulation transfer function
Optical measurement
Random white-noise target

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title = "Modulation transfer function measurement of electron multiplying CCD",

abstract = "Based on the Fourier power spectrum theory, a measurement method by means of a random white-noise pattern transparent target was presented to analyze the effect of electron multiplication (EM) on the modulation transfer function (MTF) of electron multiplying charge-coupled device (EMCCD). By building an integrated system model of EMCCD, the multiplication MTFs at different multiplication gain were measured and discussed in experiments. The experimental results show that the electron multiplication process significantly influences the system MTF, compared with non-EM, especially at high EM gain. MTF declines by an average of about 30% at Nyquist frequency. The MTF and noise of auxiliary imaging optical system and the method of focusing judgment in experiment were also discussed.",

keywords = "Electron multiplying CCD, Modulation transfer function, Optical measurement, Random white-noise target",

author = "Zhiwei Feng and Haobo Cheng and Qian Song and Yuanyuan Shang",

year = "2008",

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doi = "10.3788/AOS20082809.1710",

language = "English",

volume = "28",

pages = "1710--1716",

journal = "Guangxue Xuebao/Acta Optica Sinica",

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TY - JOUR

T1 - Modulation transfer function measurement of electron multiplying CCD

AU - Feng, Zhiwei

AU - Cheng, Haobo

AU - Song, Qian

AU - Shang, Yuanyuan

PY - 2008/9

Y1 - 2008/9

N2 - Based on the Fourier power spectrum theory, a measurement method by means of a random white-noise pattern transparent target was presented to analyze the effect of electron multiplication (EM) on the modulation transfer function (MTF) of electron multiplying charge-coupled device (EMCCD). By building an integrated system model of EMCCD, the multiplication MTFs at different multiplication gain were measured and discussed in experiments. The experimental results show that the electron multiplication process significantly influences the system MTF, compared with non-EM, especially at high EM gain. MTF declines by an average of about 30% at Nyquist frequency. The MTF and noise of auxiliary imaging optical system and the method of focusing judgment in experiment were also discussed.

AB - Based on the Fourier power spectrum theory, a measurement method by means of a random white-noise pattern transparent target was presented to analyze the effect of electron multiplication (EM) on the modulation transfer function (MTF) of electron multiplying charge-coupled device (EMCCD). By building an integrated system model of EMCCD, the multiplication MTFs at different multiplication gain were measured and discussed in experiments. The experimental results show that the electron multiplication process significantly influences the system MTF, compared with non-EM, especially at high EM gain. MTF declines by an average of about 30% at Nyquist frequency. The MTF and noise of auxiliary imaging optical system and the method of focusing judgment in experiment were also discussed.

KW - Electron multiplying CCD

KW - Modulation transfer function

KW - Optical measurement

KW - Random white-noise target

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DO - 10.3788/AOS20082809.1710

M3 - Article

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SN - 0253-2239

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SP - 1710

EP - 1716

JO - Guangxue Xuebao/Acta Optica Sinica

JF - Guangxue Xuebao/Acta Optica Sinica

IS - 9

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Modulation transfer function measurement of electron multiplying CCD

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