Methods improve micro multiple configurations

Hua Liu*, Mingsuo Li, Ronggang Zhu, Liwei Zhou

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The theory of compound zoom system and its influence and control on aberration are the basis for the design of such systems and have practical value in engineering. The principle, modeling and error analysis are analyed. Based on the system configuration of the compound zoom system, moreover, this paper advances the algorithm analysis.

源语言英语
主期刊名Optical Metrology and Inspection for Industrial Applications VII
编辑Sen Han, Gerd Ehret, Benyong Chen
出版商SPIE
ISBN(电子版)9781510639195
DOI
出版状态已出版 - 2020
活动Optical Metrology and Inspection for Industrial Applications VII 2020 - Virtual, Online, 中国
期限: 11 10月 202016 10月 2020

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
11552
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议Optical Metrology and Inspection for Industrial Applications VII 2020
国家/地区中国
Virtual, Online
时期11/10/2016/10/20

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