Lower bayes confidence limits for the reliability of one-shot products

Xin Li Yang*, Yu Bin Tian

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

摘要

Lower Bayes confidence limits of one-shot products with little present data are discussed, using three kinds of prior distributions. Beta prior distribution with k factor, double prior distribution based on Beta distribution and double prior distribution based on uniform distribution. Through analysis and study, it is concluded that the result using Beta prior distribution with k factor proves to be better than that of the WCF method, and that double prior distribution based on Beta distribution is better than double prior distribution based on uniform distribution.

源语言英语
页(从-至)544-548
页数5
期刊He Jishu/Nuclear Techniques
22
5
出版状态已出版 - 1999

指纹

探究 'Lower bayes confidence limits for the reliability of one-shot products' 的科研主题。它们共同构成独一无二的指纹。

引用此