Abstract
Lower Bayes confidence limits of one-shot products with little present data are discussed, using three kinds of prior distributions. Beta prior distribution with k factor, double prior distribution based on Beta distribution and double prior distribution based on uniform distribution. Through analysis and study, it is concluded that the result using Beta prior distribution with k factor proves to be better than that of the WCF method, and that double prior distribution based on Beta distribution is better than double prior distribution based on uniform distribution.
| Original language | English |
|---|---|
| Pages (from-to) | 544-548 |
| Number of pages | 5 |
| Journal | He Jishu/Nuclear Techniques |
| Volume | 22 |
| Issue number | 5 |
| Publication status | Published - 1999 |
Keywords
- Bayes lower confidence limits
- Prior distribution
- Reliability
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Yang, X. L., & Tian, Y. B. (1999). Lower bayes confidence limits for the reliability of one-shot products. He Jishu/Nuclear Techniques, 22(5), 544-548.