Long distance microvibration measurement using external-cavity semiconductor laser

Peng Fei Jiang; Jing Juan Zhang; Wei Rui Zhao; Fu Zeng Xie

Long distance microvibration measurement using external-cavity semiconductor laser

Peng Fei Jiang^*, Jing Juan Zhang, Wei Rui Zhao, Fu Zeng Xie

^*此作品的通讯作者

科研成果: 期刊稿件 › 文章 › 同行评审

4 引用（Scopus）

摘要

With Littrow-type external-cavity grating and temperature controlling, the spectral line width is compressed to be less than 1. 2 MHz (Δλ< 3. 5 × 10^-6 nm), while the original line-width of the semiconductor laser is broader than 1200 GHz. Based on this, the system for measuring the amplitude and frequency of the microvibration with sinusoidal modulation is designed, detecting effect is good.

源语言	英语
文章编号	1007-2276(2004)03-0253-03
页（从-至）	253-255
页数	3
期刊	Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering
卷	33
期	3
出版状态	已出版 - 6月 2004
已对外发布	是

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引用此

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title = "Long distance microvibration measurement using external-cavity semiconductor laser",

abstract = "With Littrow-type external-cavity grating and temperature controlling, the spectral line width is compressed to be less than 1. 2 MHz (Δλ< 3. 5 × 10-6 nm), while the original line-width of the semiconductor laser is broader than 1200 GHz. Based on this, the system for measuring the amplitude and frequency of the microvibration with sinusoidal modulation is designed, detecting effect is good.",

keywords = "External-cavity semiconductor laser, Interferometry, Microvibration measurement, Narrow bandwidth",

author = "Jiang, {Peng Fei} and Zhang, {Jing Juan} and Zhao, {Wei Rui} and Xie, {Fu Zeng}",

year = "2004",

month = jun,

language = "English",

volume = "33",

pages = "253--255",

journal = "Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering",

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T1 - Long distance microvibration measurement using external-cavity semiconductor laser

AU - Jiang, Peng Fei

AU - Zhang, Jing Juan

AU - Zhao, Wei Rui

AU - Xie, Fu Zeng

PY - 2004/6

Y1 - 2004/6

N2 - With Littrow-type external-cavity grating and temperature controlling, the spectral line width is compressed to be less than 1. 2 MHz (Δλ< 3. 5 × 10-6 nm), while the original line-width of the semiconductor laser is broader than 1200 GHz. Based on this, the system for measuring the amplitude and frequency of the microvibration with sinusoidal modulation is designed, detecting effect is good.

AB - With Littrow-type external-cavity grating and temperature controlling, the spectral line width is compressed to be less than 1. 2 MHz (Δλ< 3. 5 × 10-6 nm), while the original line-width of the semiconductor laser is broader than 1200 GHz. Based on this, the system for measuring the amplitude and frequency of the microvibration with sinusoidal modulation is designed, detecting effect is good.

KW - External-cavity semiconductor laser

KW - Interferometry

KW - Microvibration measurement

KW - Narrow bandwidth

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M3 - Article

AN - SCOPUS:15744367794

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JF - Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering

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M1 - 1007-2276(2004)03-0253-03

ER -

Long distance microvibration measurement using external-cavity semiconductor laser

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