Long distance microvibration measurement using external-cavity semiconductor laser

Peng Fei Jiang; Jing Juan Zhang; Wei Rui Zhao; Fu Zeng Xie

Long distance microvibration measurement using external-cavity semiconductor laser

Peng Fei Jiang^*, Jing Juan Zhang, Wei Rui Zhao, Fu Zeng Xie

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

With Littrow-type external-cavity grating and temperature controlling, the spectral line width is compressed to be less than 1. 2 MHz (Δλ< 3. 5 × 10^-6 nm), while the original line-width of the semiconductor laser is broader than 1200 GHz. Based on this, the system for measuring the amplitude and frequency of the microvibration with sinusoidal modulation is designed, detecting effect is good.

Original language	English
Article number	1007-2276(2004)03-0253-03
Pages (from-to)	253-255
Number of pages	3
Journal	Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering
Volume	33
Issue number	3
Publication status	Published - Jun 2004
Externally published	Yes

Keywords

External-cavity semiconductor laser
Interferometry
Microvibration measurement
Narrow bandwidth

Cite this

Jiang, P. F., Zhang, J. J., Zhao, W. R., & Xie, F. Z. (2004). Long distance microvibration measurement using external-cavity semiconductor laser. Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering, 33(3), 253-255. Article 1007-2276(2004)03-0253-03.

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abstract = "With Littrow-type external-cavity grating and temperature controlling, the spectral line width is compressed to be less than 1. 2 MHz (Δλ< 3. 5 × 10-6 nm), while the original line-width of the semiconductor laser is broader than 1200 GHz. Based on this, the system for measuring the amplitude and frequency of the microvibration with sinusoidal modulation is designed, detecting effect is good.",

keywords = "External-cavity semiconductor laser, Interferometry, Microvibration measurement, Narrow bandwidth",

author = "Jiang, {Peng Fei} and Zhang, {Jing Juan} and Zhao, {Wei Rui} and Xie, {Fu Zeng}",

year = "2004",

month = jun,

language = "English",

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pages = "253--255",

journal = "Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering",

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T1 - Long distance microvibration measurement using external-cavity semiconductor laser

AU - Jiang, Peng Fei

AU - Zhang, Jing Juan

AU - Zhao, Wei Rui

AU - Xie, Fu Zeng

PY - 2004/6

Y1 - 2004/6

N2 - With Littrow-type external-cavity grating and temperature controlling, the spectral line width is compressed to be less than 1. 2 MHz (Δλ< 3. 5 × 10-6 nm), while the original line-width of the semiconductor laser is broader than 1200 GHz. Based on this, the system for measuring the amplitude and frequency of the microvibration with sinusoidal modulation is designed, detecting effect is good.

AB - With Littrow-type external-cavity grating and temperature controlling, the spectral line width is compressed to be less than 1. 2 MHz (Δλ< 3. 5 × 10-6 nm), while the original line-width of the semiconductor laser is broader than 1200 GHz. Based on this, the system for measuring the amplitude and frequency of the microvibration with sinusoidal modulation is designed, detecting effect is good.

KW - External-cavity semiconductor laser

KW - Interferometry

KW - Microvibration measurement

KW - Narrow bandwidth

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M3 - Article

AN - SCOPUS:15744367794

SN - 1007-2276

VL - 33

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JO - Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering

JF - Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering

IS - 3

M1 - 1007-2276(2004)03-0253-03

ER -

Long distance microvibration measurement using external-cavity semiconductor laser

Abstract

Keywords

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