摘要
We investigated the relationship between crystallinity, deep trap states and PEC performance of g-C3N4 photoelectrodes. Long-lived charge carriers were present in the more poorly crystalline samples, due to deeper trap states, which inversely correlated with photoelectrochemical performance. The charge diffusion length in a compact g-C3N4 film was determined to be ca. 1000 nm.
源语言 | 英语 |
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页(从-至) | 7191-7194 |
页数 | 4 |
期刊 | Chemical Communications |
卷 | 55 |
期 | 50 |
DOI | |
出版状态 | 已出版 - 2019 |
已对外发布 | 是 |