Abstract
We investigated the relationship between crystallinity, deep trap states and PEC performance of g-C3N4 photoelectrodes. Long-lived charge carriers were present in the more poorly crystalline samples, due to deeper trap states, which inversely correlated with photoelectrochemical performance. The charge diffusion length in a compact g-C3N4 film was determined to be ca. 1000 nm.
Original language | English |
---|---|
Pages (from-to) | 7191-7194 |
Number of pages | 4 |
Journal | Chemical Communications |
Volume | 55 |
Issue number | 50 |
DOIs | |
Publication status | Published - 2019 |
Externally published | Yes |