Gap State-Modulated Van Der Waals Short-Term Memory with Broad Band Negative Photoconductance

Boyu Xu, Dan Guo, Weikang Dong, Huiying Gao, Peng Zhu, Zhiwei Wang, Kenji Watanabe, Takashi Taniguchi, Zhaochu Luo, Fawei Zheng, Shoujun Zheng*, Jiadong Zhou*

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

1 引用 (Scopus)

摘要

Floating gate memory (FGM), composed of van der Waals (vdW) junctions with an atomically thin floating layer for charge storage, is widely employed to develop logic-in memories and in-sensor computing devices. Most research efforts of FGM are spent on achieving long-term charge storage and fast reading/writing for flash and random-access memory. However, dynamic modulation of memory time via a tunneling barrier and vdW interfaces, which is critical for synaptic computing and machine vision, is still lacking. Here, a van der Waals short-term memory with tunable memory windows and retention times from milliseconds to thousands of seconds is reported, which is approximately exponentially proportional to the thickness h-BN (hexagonal boron nitride) barrier. The specific h-BN barrier with fruitful gap states provides charge release channels for trapped charges, making the vdW device switchable between positive photoconductance and negative photoconductance with a broadband light from IR to UV range. The dynamic short-term memory with tunable photo response highlights the design strategy of novel vdW memory vis interface engineering for further intelligent information storage and optoelectronic detection.

源语言英语
文章编号2309626
期刊Small
20
21
DOI
出版状态已出版 - 23 5月 2024

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