Field-effect at electrical contacts to two-dimensional materials

Yao Guo*, Yan Sun, Alvin Tang, Ching Hua Wang, Yanqing Zhao, Mengmeng Bai, Shuting Xu, Zheqi Xu, Tao Tang, Sheng Wang, Chenguang Qiu, Kang Xu, Xubiao Peng, Junfeng Han, Eric Pop, Yang Chai*

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

11 引用 (Scopus)

摘要

The inferior electrical contact to two-dimensional (2D) materials is a critical challenge for their application in post-silicon very large-scale integrated circuits. Electrical contacts were generally related to their resistive effect, quantified as contact resistance. With a systematic investigation, this work demonstrates a capacitive metal-insulator-semiconductor (MIS) field-effect at the electrical contacts to 2D materials: The field-effect depletes or accumulates charge carriers, redistributes the voltage potential, and gives rise to abnormal current saturation and nonlinearity. On one hand, the current saturation hinders the devices’ driving ability, which can be eliminated with carefully engineered contact configurations. On the other hand, by introducing the nonlinearity to monolithic analog artificial neural network circuits, the circuits’ perception ability can be significantly enhanced, as evidenced using a coronavirus disease 2019 (COVID-19) critical illness prediction model. This work provides a comprehension of the field-effect at the electrical contacts to 2D materials, which is fundamental to the design, simulation, and fabrication of electronics based on 2D materials.[Figure not available: see fulltext.]

源语言英语
页(从-至)4894-4900
页数7
期刊Nano Research
14
12
DOI
出版状态已出版 - 12月 2021

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