摘要
We have studied down-conversion photoluminescence (PL) from (Ce, Yb) co-doped "oxygen rich" silicon oxide films prepared by sputtering and annealing. The Ce3+ ∼510 nm PL is sensitive to the Ce concentration of the films and is much stronger for 3 at. % Ce than for 2 at. % Ce after annealing at 1200 °C. The PL emission and excitation spectroscopy results indicate that the excitation of Yb3+ is mainly through an energy transfer from Ce3+ to Yb3+, oxide defects also play a role in the excitation of Yb3+ after lower temperature (∼800 °C) annealing. The Ce3+ 510 nm photon excites mostly only one Yb3+ 980 nm photon. Temperature-dependent PL measurements suggest that the energy transfer from Ce3+ to Yb3+ is partly thermally activated.
源语言 | 英语 |
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文章编号 | 123105 |
期刊 | Journal of Applied Physics |
卷 | 119 |
期 | 12 |
DOI | |
出版状态 | 已出版 - 28 3月 2016 |