A white-light interferometry for the measurement of high-finesse fiber optic EFPI sensors

Zhen Wang*, Yi Jiang, Wenhui Ding, Ran Gao

*此作品的通讯作者

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摘要

A white-light interferometry based on the Fourier transform method is proposed to measure the optical path difference (OPD) of the high-finesse fiber optic extrinsic Fabry-Pérot interferometric (EFPI) sensor. The Fourier spectrum of the transmission spectrum signal consists of multiple frequency components because of the multiple-beam interference occurring in the high-finesse EFPI sensor. The high-order frequency component of the Fourier spectrum can be extracted by the Fourier transform method to recover the OPD in order to overcome the spectrum overlapping, which happens when the OPD of the EFPI sensor is short. In the experiment, a high-finesse fiber optic EFPI sensor with the cavity length of 120 μm is measured, and the second-order frequency component was extracted to recover the cavity length. The standard deviation of the measurement results was 9.132 nm. The measurement range of the Fourier transform method was effectively extended to the short OPD.

源语言英语
文章编号2332558
页(从-至)2138-2141
页数4
期刊IEEE Photonics Technology Letters
26
21
DOI
出版状态已出版 - 1 11月 2014

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Wang, Z., Jiang, Y., Ding, W., & Gao, R. (2014). A white-light interferometry for the measurement of high-finesse fiber optic EFPI sensors. IEEE Photonics Technology Letters, 26(21), 2138-2141. 文章 2332558. https://doi.org/10.1109/LPT.2014.2332558