A white-light interferometry for the measurement of high-finesse fiber optic EFPI sensors

Zhen Wang*, Yi Jiang, Wenhui Ding, Ran Gao

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Abstract

A white-light interferometry based on the Fourier transform method is proposed to measure the optical path difference (OPD) of the high-finesse fiber optic extrinsic Fabry-Pérot interferometric (EFPI) sensor. The Fourier spectrum of the transmission spectrum signal consists of multiple frequency components because of the multiple-beam interference occurring in the high-finesse EFPI sensor. The high-order frequency component of the Fourier spectrum can be extracted by the Fourier transform method to recover the OPD in order to overcome the spectrum overlapping, which happens when the OPD of the EFPI sensor is short. In the experiment, a high-finesse fiber optic EFPI sensor with the cavity length of 120 μm is measured, and the second-order frequency component was extracted to recover the cavity length. The standard deviation of the measurement results was 9.132 nm. The measurement range of the Fourier transform method was effectively extended to the short OPD.

Original languageEnglish
Article number2332558
Pages (from-to)2138-2141
Number of pages4
JournalIEEE Photonics Technology Letters
Volume26
Issue number21
DOIs
Publication statusPublished - 1 Nov 2014

Keywords

  • Fabry-Pérot interferometers
  • Fourier transforms
  • Optical fiber sensors
  • White-light interferometry

Fingerprint

Dive into the research topics of 'A white-light interferometry for the measurement of high-finesse fiber optic EFPI sensors'. Together they form a unique fingerprint.

Cite this