Tunable Electronic Structures in Wrinkled 2D Transition-Metal-Trichalcogenide (TMT) HfTe3 Films

Yu Qi Wang, Xu Wu, Yan Feng Ge, Ye Liang Wang*, Haiming Guo, Yan Shao, Tao Lei, Chen Liu, Jia Ou Wang, Shi Yu Zhu, Zhong Liu Liu, Wei Guo, Kurash Ibrahim, Yu Gui Yao, Hong Jun Gao

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

2D materials with anisotropic symmetry are likely, in general, to possess strain that is artificially adjustable in a single direction, inspiring strategies of artificial regulation of local structures and related properties. Herein, strain-induced wrinkles in an anisotropic 2D transition-metal-trichalcogenide HfTe3 film are fabricated and illustrated for the first time. The corresponding localized electronic structures in the 1D corrugated wrinkles are revealed by a combination of experiment and simulation. The wrinkled HfTe3 film probably features electrical transport properties never before seen and useful for developing wrinkle-based heterojunctions for novel nanoelectronic devices.

Original languageEnglish
Article number1600324
JournalAdvanced Electronic Materials
Volume2
Issue number12
DOIs
Publication statusPublished - 1 Dec 2016

Keywords

  • 2D materials
  • HfTe
  • electronic structures
  • transition-metal-trichalcogenide

Fingerprint

Dive into the research topics of 'Tunable Electronic Structures in Wrinkled 2D Transition-Metal-Trichalcogenide (TMT) HfTe3 Films'. Together they form a unique fingerprint.

Cite this