Three-dimensional displacement measurement of image point by point-diffraction interferometry

Xiao He, Lingfeng Chen, Xiaojie Meng, Lei Yu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper presents a method for measuring the three-dimensional (3-D) displacement of an image point based on point-diffraction interferometry. An object Point-light-source (PLS) interferes with a fixed PLS and its interferograms are captured by an exit pupil. When the image point of the object PLS is slightly shifted to a new position, the wavefront of the image PLS changes. And its interferograms also change. Processing these figures (captured before and after the movement), the wavefront difference of the image PLS can be obtained and it contains the information of three-dimensional (3-D) displacement of the image PLS. However, the information of its three-dimensional (3-D) displacement cannot be calculated until the distance between the image PLS and the exit pupil is calibrated. Therefore, we use a plane-parallel-plate with a known refractive index and thickness to determine this distance, which is based on the Snell's law for small angle of incidence. Thus, since the distance between the exit pupil and the image PLS is a known quantity, the 3-D displacement of the image PLS can be simultaneously calculated through two interference measurements. Preliminary experimental results indicate that its relative error is below 0.3%. With the ability to accurately locate an image point (whatever it is real or virtual), a fiber point-light-source can act as the reticle by itself in optical measurement.

Original languageEnglish
Title of host publication2017 International Conference on Optical Instruments and Technology
Subtitle of host publicationOptoelectronic Measurement Technology and Systems
EditorsKexin Xu, Hai Xiao, Jigui Zhu, Hwa-Yaw Tam
PublisherSPIE
ISBN (Electronic)9781510617537
DOIs
Publication statusPublished - 2018
Event2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Beijing, China
Duration: 28 Oct 201730 Oct 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10621
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Country/TerritoryChina
CityBeijing
Period28/10/1730/10/17

Keywords

  • (3-D) displacement
  • Point-Diffraction Interferometry
  • image point

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