TY - GEN
T1 - The influences of quenching times on the property of thermal oxidized iridium pH sensor
AU - Huang, F. F.
AU - Jin, Y.
AU - Wen, L.
AU - Mu, D. B.
AU - Cui, M. M.
PY - 2013
Y1 - 2013
N2 - The iridium/iridium oxide pH sensors were fabricated by thermal oxidation, during which one, two and three times of quenching were performed in deionized water, respectively. The characteristics and properties of the sensors developed with different quenching times were examined extensively, which include surface morphology, section structure, porosity distribution, as well as the linear range of E-pH response, pH response rate, and the long time stability, etc. It is found that the sensors quenched for three times appear to show better performance. Electrochemical impedance spectra (EIS) of the iridium oxide electrodes were investigated in pH buffer to analyze the pH response mechanism of the electrode.
AB - The iridium/iridium oxide pH sensors were fabricated by thermal oxidation, during which one, two and three times of quenching were performed in deionized water, respectively. The characteristics and properties of the sensors developed with different quenching times were examined extensively, which include surface morphology, section structure, porosity distribution, as well as the linear range of E-pH response, pH response rate, and the long time stability, etc. It is found that the sensors quenched for three times appear to show better performance. Electrochemical impedance spectra (EIS) of the iridium oxide electrodes were investigated in pH buffer to analyze the pH response mechanism of the electrode.
UR - http://www.scopus.com/inward/record.url?scp=84885700704&partnerID=8YFLogxK
U2 - 10.1149/05012.0237ecst
DO - 10.1149/05012.0237ecst
M3 - Conference contribution
AN - SCOPUS:84885700704
SN - 9781607683605
T3 - ECS Transactions
SP - 237
EP - 248
BT - Chemical Sensors 10 -and- MEMS/NEMS 10
PB - Electrochemical Society Inc.
T2 - Symposia on Chemical Sensors 10 - Chemical and Biological Sensors and Analytical Systems and Microfabricated and Nanofabricated Systems for MEMS/NEMS 10 - 222nd ECS Meeting/PRiME 2012
Y2 - 7 October 2012 through 12 October 2012
ER -