Support vector machine based on Genetic Algorithm integrated navigation fault detection parameter optimization method

Huaijian Li, Jing Fang, Xiaojing Du*, Ziye Hu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In order to solve the problem of low fault detection rate of combinatorial navigation due to the mismatch of support vector machine parameters, this paper uses genetic algorithm and lattice search method to find the optimal support vector machine penalty parameter C and kernel function parameter g. The result of the search is brought into the support vector machine to obtain the classification model and finally classify the combinatorial navigation data. The results show that the genetic algorithm has a faster search speed and a higher classification accuracy.

Original languageEnglish
Title of host publication2022 4th International Conference on Data-Driven Optimization of Complex Systems, DOCS 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665459822
DOIs
Publication statusPublished - 2022
Event4th International Conference on Data-Driven Optimization of Complex Systems, DOCS 2022 - Chengdu, China
Duration: 28 Oct 202230 Oct 2022

Publication series

Name2022 4th International Conference on Data-Driven Optimization of Complex Systems, DOCS 2022

Conference

Conference4th International Conference on Data-Driven Optimization of Complex Systems, DOCS 2022
Country/TerritoryChina
CityChengdu
Period28/10/2230/10/22

Keywords

  • Genetic Algorithm
  • Integrated navigation system
  • fault detection
  • support vector machine

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Li, H., Fang, J., Du, X., & Hu, Z. (2022). Support vector machine based on Genetic Algorithm integrated navigation fault detection parameter optimization method. In 2022 4th International Conference on Data-Driven Optimization of Complex Systems, DOCS 2022 (2022 4th International Conference on Data-Driven Optimization of Complex Systems, DOCS 2022). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DOCS55193.2022.9967741