Study on the stitching interferometry for the surface profile measurement of a large aperture component

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Abstract

The stitching interferometry for the surface profile measurement of a large aperture component is studied. To analyze the overlapping region interferogram of the adjacent subapertures with Scale Invariant Feature Transform(SIFT) algorithm, the stitching parameters of the adjacent subapertures and then overall surface information of the tested component can be obtained. SIFT algorithm of subaperture positioning, interferogram processing, phase unwrapping, Zernike polynomials wavefront fitting and subaperture wavefront stitching programs are written. A principle experiment has been carried out. Compared with the measurement results between the stitching interferometry and full caliber testing, the deviation of RMS is less than 2nm.

Original languageEnglish
Title of host publicationDimensional Optical Metrology and Inspection for Practical Applications III
PublisherSPIE
ISBN (Print)9781628410471
DOIs
Publication statusPublished - 2014
EventDimensional Optical Metrology and Inspection for Practical Applications III - Baltimore, MD, United States
Duration: 5 May 20146 May 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9110
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceDimensional Optical Metrology and Inspection for Practical Applications III
Country/TerritoryUnited States
CityBaltimore, MD
Period5/05/146/05/14

Keywords

  • Large aperture component
  • SIFT algorithm
  • Zernike fitting
  • phase-shifting interferometry
  • subaperture stitching

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