@inproceedings{0faa17aca1d14d868b1e9e05a2c049c5,
title = "Study on non-phase-shifting phase retrieval methods for interferogram with large phase gradient",
abstract = "As a non-contact, high-precision optical component testing method, interferometry performs the measurement by solving the interferogram containing the phase information of the object to be measured. The non-mechanical-phase-shifting phase retrieval method based on single or two interferograms has the advantages of good vibration resistance, fast speed and simple system, which can meet the increasingly urgent online and on-site detection requirements. Aiming at the large gradient phase detection requirements in processing, this paper compares the accuracy of typical non-mechanical-phaseshifting interferometric phase retrieval methods, including carrier Fourier method, digital moir{\'e} interferometry (DMI), and two DMI-based methods, namely two-step carrier stitching method and DMI combined with Newton iterative algorithm proposed by the authors. In this paper, the influences of the magnitude of the phase gradient and the noise of the interferogram on the phase retrieval accuracy of the above methods are analyzed. The simulation results in this paper will provide a theoretical basis for the selection of algorithms for in situ interferometry.",
keywords = "Accuracy, Frequency aliasing, Interferogram, Phase gradient, Phase retrieval",
author = "Yao Hu and Xueyin Sun and Shaopu Wang and Mingzhe Ye and Qun Hao",
note = "Publisher Copyright: {\textcopyright} COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.; 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems ; Conference date: 26-10-2019 Through 28-10-2019",
year = "2020",
doi = "10.1117/12.2541761",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Jigui Zhu and Kexin Xu and Hai Xiao and Sen Han",
booktitle = "2019 International Conference on Optical Instruments and Technology",
address = "United States",
}