Study on crack propagation in ferroelectric single crystal under electric loading

Y. Jiang, Y. Zhang, B. Liu*, D. Fang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

20 Citations (Scopus)

Abstract

The crack propagation in ferroelectric single crystals subjected to electric fields was studied experimentally and theoretically. An in situ observation of crack propagation and domain switching near the crack tip in a poled PMN-PT62/38 single crystal was carried out using polarized optical microscopy. It was found that a pure negative electric field leads to a larger domain switching zone near the crack tip than a positive one does. A negative electric field below the coercive field can cause crack propagation, while no crack growth was observed for a positive electric field far larger than the coercive field. A fracture model based on energy analysis was developed which indicates that the energy variation due to the domain switching provides the thermodynamic driving force for the crack propagation under pure electric loading. The critical electrical loading for the crack growth determined by this model agrees well with experiments.

Original languageEnglish
Pages (from-to)1630-1638
Number of pages9
JournalActa Materialia
Volume57
Issue number5
DOIs
Publication statusPublished - Mar 2009
Externally publishedYes

Keywords

  • Domain switching
  • Ferroelectricity
  • Fracture

Fingerprint

Dive into the research topics of 'Study on crack propagation in ferroelectric single crystal under electric loading'. Together they form a unique fingerprint.

Cite this