Scanning tunneling microscopy and spectroscopy of twisted trilayer graphene

Wei Jie Zuo, Jia Bin Qiao, Dong Lin Ma, Long Jing Yin, Gan Sun, Jun Yang Zhang, Li Yang Guan, Lin He

Research output: Contribution to journalArticlepeer-review

34 Citations (Scopus)

Abstract

Twist, as a simple and unique degree of freedom, could lead to enormous novel quantum phenomena in bilayer graphene. A small rotation angle introduces low-energy van Hove singularities (VHSs) approaching the Fermi level, which result in unusual correlated states in the bilayer graphene. It is reasonable to expect that the twist could also affect the electronic properties of few-layer graphene dramatically. However, such an issue has remained experimentally elusive. Here, by using scanning tunneling microscopy/spectroscopy (STM/STS), we systematically studied a twisted trilayer graphene (TTG) with two different small twist angles between adjacent layers. Two sets of VHSs, originating from the two twist angles, were observed in the TTG, indicating that the TTG could be simply regarded as a combination of two different twisted bilayers of graphene. By using high-resolution STS, we observed a split of the VHSs and directly imaged the spatial symmetry breaking of electronic states around the VHSs. These results suggest that electron-electron interactions play an important role in affecting the electronic properties of graphene systems with low-energy VHSs.

Original languageEnglish
Article number035440
JournalPhysical Review B
Volume97
Issue number3
DOIs
Publication statusPublished - 30 Jan 2018
Externally publishedYes

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