Abstract
The m-plane-oriented gallium nitride (GaN) nanoplates were successfully grown on silicon (Si) substrates at 450 C, using laser-assisted metal organic chemical vapor deposition (L-MOCVD). The morphology and <101Ì...0> orientation of the nanoplates were confirmed using high-resolution electron microscopes. GaN nanoplates served as seed crystals for the subsequent growth of m-plane-oriented interlinked GaN nanoplates at a longer growth time. The strong A1 (TO) mode in Raman spectra and the (101Ì...0) peak in X-ray diffraction confirmed the m plane orientation of the nanoplates. The interlinked GaN nanoplates showed a high-growth rate of ∼38 μm/h. The results suggest that L-MOCVD is a promising technique for the rapid growth of m-plane-oriented GaN nanoplates on the Si substrates at low-growth temperatures.
Original language | English |
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Pages (from-to) | 3171-3176 |
Number of pages | 6 |
Journal | Crystal Growth and Design |
Volume | 13 |
Issue number | 7 |
DOIs | |
Publication status | Published - 3 Jul 2013 |