Probing thermal expansion coefficients of monolayers using surface enhanced Raman scattering

Duan Zhang, Ye Cun Wu, Mei Yang, Xiao Liu, Cormac Coileáin, Hongjun Xu, Mourad Abid, Mohamed Abid, Jing Jing Wang, Igor V. Shvets, Haonan Liu, Zhi Wang, Hongxing Yin, Huajun Liu, Byong Sun Chun, Xiangdong Zhang, Han Chun Wu*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

22 Citations (Scopus)

Abstract

Monolayer transition metal dichalcogenides exhibit remarkable electronic and optical properties, making them candidates for application within flexible nano-optoelectronics, however direct experimental determination of their thermal expansion coefficients (TECs) is difficult. Here, we propose a non-destructive method to probe the TECs of monolayer materials using surface-enhanced Raman spectroscopy (SERS). A strongly coupled Ag nanoparticle over-layer is used to controllably introduce temperature dependent strain in monolayers. Changes in the first-order temperature coefficient of the Raman shift, produced by TEC mismatch, can be used to estimate relative expansion coefficient of the monolayer. As a demonstration, the linear TEC of monolayer WS2 is probed and is found to be 10.3 × 10-6 K-1, which would appear support theoretical predictions of a small TEC. This method opens a route to probe and control the TECs of monolayer materials.

Original languageEnglish
Pages (from-to)99053-99059
Number of pages7
JournalRSC Advances
Volume6
Issue number101
DOIs
Publication statusPublished - 2016

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