Abstract
Monolayer transition metal dichalcogenides exhibit remarkable electronic and optical properties, making them candidates for application within flexible nano-optoelectronics, however direct experimental determination of their thermal expansion coefficients (TECs) is difficult. Here, we propose a non-destructive method to probe the TECs of monolayer materials using surface-enhanced Raman spectroscopy (SERS). A strongly coupled Ag nanoparticle over-layer is used to controllably introduce temperature dependent strain in monolayers. Changes in the first-order temperature coefficient of the Raman shift, produced by TEC mismatch, can be used to estimate relative expansion coefficient of the monolayer. As a demonstration, the linear TEC of monolayer WS2 is probed and is found to be 10.3 × 10-6 K-1, which would appear support theoretical predictions of a small TEC. This method opens a route to probe and control the TECs of monolayer materials.
Original language | English |
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Pages (from-to) | 99053-99059 |
Number of pages | 7 |
Journal | RSC Advances |
Volume | 6 |
Issue number | 101 |
DOIs | |
Publication status | Published - 2016 |