@inproceedings{b557bd7a94df4c5dbbac7857c6fb5459,
title = "Phase-stepping method for whole-field photoelastic stress analysis using plane polariscope setup",
abstract = "A new six-step phase shifting method is presented in this paper to determine the phase retardation for whole-field photoelastic stress analysis in optical glass based on the plane polariscope setup. This new phase stepping strategy is of no quarter wave plate errors and with less intensity variations of emerging light. By this method, it's not necessary to determine the isoclinic angles in advance when measuring the phase retardations, so the data processing will be simplified and the isoclinic angle errors will cause no influnces on the measurement. A plane polariscope is setup including a LED array light source, rotatable dichroic polymer film polarizer and analyser, a digital CCD camera and image grab system. Two mica waveplates with known phase retardances are measured, and the experimental results agree well with the those values. This method is expected to be used for the stress induced birefringence test in optical glass.",
keywords = "Stress analysis, phase-stepping, plane polariscope, quantization error",
author = "Xusheng Zhang and Lingfeng Chen and Chuan He",
year = "2010",
doi = "10.1117/12.865999",
language = "English",
isbn = "9780819480866",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
number = "PART 1",
booktitle = "5th International Symposium on Advanced Optical Manufacturing and Testing Technologies",
edition = "PART 1",
note = "5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment ; Conference date: 26-04-2010 Through 29-04-2010",
}