New methods for diagnosing high resolution A/D and D/A converters

New methods for A/D and D/A converter diagnosis at the bit level are presented in this paper. An error function is built of which the variables are bit states while estimative parameters are the bit errors and the superposition errors. Two kinds of methods for estimating the bit errors and the superposition errors are considered. One is a direct method that estimates the parameters by adopting the error function; another is an indirect method that uses Walsh transform of the error function. In order to reduce the calculation burden and to save memory space, two fast algorithms with a modest amount of addition and multiplication are proposed. These algorithms are simple, accurate, reliable, and easy to realize.