Nanometre moire fringes in scanning tunnelling microscopy of surface lattices

H. M. Guo; H. W. Liu; Y. L. Wang; H. J. Gao; H. X. Shang; Z. W. Liu; H. M. Xie; F. L. Dai

doi:10.1088/0957-4484/15/8/022

Nanometre moire fringes in scanning tunnelling microscopy of surface lattices

H. M. Guo, H. W. Liu, Y. L. Wang, H. J. Gao^*, H. X. Shang, Z. W. Liu, H. M. Xie, F. L. Dai

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

A novel class of moire fringe patterns in scanning tunnelling microscope (STM) imaging is presented and analysed in this paper. The moire fringe is generated from the interference of the atomic lattice of the specimen and STM scanning lines. Both parallel and rotational STM moire fringes of the surface of highly oriented pyrolytic graphite (HOPG) are investigated. The formation principle and experimental techniques of STM moire fringes are discussed. Nanometre scale resolution and sensitivity are found in the moire fringe patterns. They precisely magnify the STM image of lattice irregularities. A potential application - measuring surface deformation and defects in the nanometre range - is proposed.

Original language	English
Pages (from-to)	991-995
Number of pages	5
Journal	Nanotechnology
Volume	15
Issue number	8
DOIs	https://doi.org/10.1088/0957-4484/15/8/022
Publication status	Published - Aug 2004
Externally published	Yes

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title = "Nanometre moire fringes in scanning tunnelling microscopy of surface lattices",

abstract = "A novel class of moire fringe patterns in scanning tunnelling microscope (STM) imaging is presented and analysed in this paper. The moire fringe is generated from the interference of the atomic lattice of the specimen and STM scanning lines. Both parallel and rotational STM moire fringes of the surface of highly oriented pyrolytic graphite (HOPG) are investigated. The formation principle and experimental techniques of STM moire fringes are discussed. Nanometre scale resolution and sensitivity are found in the moire fringe patterns. They precisely magnify the STM image of lattice irregularities. A potential application - measuring surface deformation and defects in the nanometre range - is proposed.",

author = "Guo, {H. M.} and Liu, {H. W.} and Wang, {Y. L.} and Gao, {H. J.} and Shang, {H. X.} and Liu, {Z. W.} and Xie, {H. M.} and Dai, {F. L.}",

year = "2004",

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doi = "10.1088/0957-4484/15/8/022",

language = "English",

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T1 - Nanometre moire fringes in scanning tunnelling microscopy of surface lattices

AU - Guo, H. M.

AU - Liu, H. W.

AU - Wang, Y. L.

AU - Gao, H. J.

AU - Shang, H. X.

AU - Liu, Z. W.

AU - Xie, H. M.

AU - Dai, F. L.

PY - 2004/8

Y1 - 2004/8

N2 - A novel class of moire fringe patterns in scanning tunnelling microscope (STM) imaging is presented and analysed in this paper. The moire fringe is generated from the interference of the atomic lattice of the specimen and STM scanning lines. Both parallel and rotational STM moire fringes of the surface of highly oriented pyrolytic graphite (HOPG) are investigated. The formation principle and experimental techniques of STM moire fringes are discussed. Nanometre scale resolution and sensitivity are found in the moire fringe patterns. They precisely magnify the STM image of lattice irregularities. A potential application - measuring surface deformation and defects in the nanometre range - is proposed.

AB - A novel class of moire fringe patterns in scanning tunnelling microscope (STM) imaging is presented and analysed in this paper. The moire fringe is generated from the interference of the atomic lattice of the specimen and STM scanning lines. Both parallel and rotational STM moire fringes of the surface of highly oriented pyrolytic graphite (HOPG) are investigated. The formation principle and experimental techniques of STM moire fringes are discussed. Nanometre scale resolution and sensitivity are found in the moire fringe patterns. They precisely magnify the STM image of lattice irregularities. A potential application - measuring surface deformation and defects in the nanometre range - is proposed.

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DO - 10.1088/0957-4484/15/8/022

M3 - Article

AN - SCOPUS:4344584560

SN - 0957-4484

VL - 15

SP - 991

EP - 995

JO - Nanotechnology

JF - Nanotechnology

IS - 8

ER -

Nanometre moire fringes in scanning tunnelling microscopy of surface lattices

Abstract

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