@inproceedings{3e2bcaed9bd3458888764f87aa17c8fa,
title = "Microscopic image enhancement based on Fourier ptychography technique",
abstract = "Image enhancement technique is utilized to emphasize the overall or local characteristics of pictures and widely used in aerospace, and machine vision application. However, most of these techniques are mathematical algorithms based on captured pictures instead of the imaging process. Fourier ptychographic microscopy (FPM) is a recently developed computational imaging approach which stitches together low-resolution images acquired under different angles of illumination with the same intensity in Fourier space to produce a wide-field, high-resolution complex sample image. In this article, a theoretical model about the illumination intensity is proposed. The effect of uneven illumination intensity can be reduced significantly based on our model. Furthermore, the quality of the reconstructed image can be enhanced by adjusting the intensity of the illumination light corresponding to the high frequency components of the original spectrum.",
keywords = "Computational imaging., Fourier ptychography technique, Illumination intensity adjustment, Image enhancement, LED illumination",
author = "Ying Wang and Guocheng Zhou and Yao Hu and Xuemin Cheng and Qun Hao and Shaohui Zhang",
note = "Publisher Copyright: {\textcopyright} COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.; Computational Imaging IV 2019 ; Conference date: 14-04-2019 Through 15-04-2019",
year = "2019",
doi = "10.1117/12.2519602",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Abhijit Mahalanobis and Lei Tian and Petruccelli, {Jonathan C.}",
booktitle = "Computational Imaging IV",
address = "United States",
}