@inproceedings{345a8eeb90734235ad3bd7ba7e26db61,
title = "Microlens array wavefront measurement based on Transport of intensity equation and hybrid Gerchberg and Saxton iteration",
abstract = "Microlens arrays are widely used in various industrial cameras and detectors, and their wavefront consistency directly affects the performance of optical systems. The current non-interferometry computational imaging methods for measuring the wavefront of microlens arrays typically produce boundary artifacts and partially dope noise of high-frequency information. In order to accurately study and measure the consistency, relative position and wavefront aberration of each element in the microlens array. This paper presents a computational imaging method based on the intensity transfer equation (TIE) of discrete cosine transform (DCT) analysis and a novel hybrid Gerchberg-Saxton iteration (HGS-TIE) combining error reduction algorithm and input/output algorithm.This algorithm improves the accuracy of high-frequency phase measurement at the transitions between microlens and substrate. At the same time, boundary artifacts are eliminated, improving the overall accuracy of the measurement.",
keywords = "Angular spectrum iteration algorithm, Microlens array, Optical properties, Phase reconstruction, Transport of intensity equation",
author = "Yuanheng Liu and Yao Hu and Zichen Wang and Qun Hao",
note = "Publisher Copyright: {\textcopyright} 2023 SPIE. All rights reserved.; Optoelectronic Imaging and Multimedia Technology X 2023 ; Conference date: 15-10-2023 Through 16-10-2023",
year = "2023",
doi = "10.1117/12.2687564",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Qionghai Dai and Tsutomu Shimura and Zhenrong Zheng",
booktitle = "Optoelectronic Imaging and Multimedia Technology X",
address = "United States",
}