Abstract
In order to solve the application scope of traditional zoom system, the method of adding new sensors and components, and update the design method and structure configuration is used. on the basis of geometrical optics and the aberration theory, the results show that system is optimized by without changing the lens on weight, size and structure. At the same time the design degrees of freedom is increased, thus breaking restrictions in some kind of zoom systems is been breaking.
Original language | English |
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Title of host publication | 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies |
Subtitle of host publication | Design Manufacturing, and Testing of Micro- and Nano-Optical Devices, and Systems |
Editors | A.G. Poleshchuk, Tianchun Ye, Song Hu |
Publisher | SPIE |
ISBN (Electronic) | 9781628413588 |
DOIs | |
Publication status | Published - 2014 |
Externally published | Yes |
Event | 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design Manufacturing, and Testing of Micro- and Nano-Optical Devices, and Systems, AOMATT 2014 - Harbin, China Duration: 26 Apr 2014 → 29 Apr 2014 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 9283 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design Manufacturing, and Testing of Micro- and Nano-Optical Devices, and Systems, AOMATT 2014 |
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Country/Territory | China |
City | Harbin |
Period | 26/04/14 → 29/04/14 |
Keywords
- Global Methods
- Optical design
- Optimization
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Liu, H., Ding, Q., & Zhou, L. (2014). Methods on micro lens compact applied in zoom systems. In A. G. Poleshchuk, T. Ye, & S. Hu (Eds.), 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design Manufacturing, and Testing of Micro- and Nano-Optical Devices, and Systems Article 92830C (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9283). SPIE. https://doi.org/10.1117/12.2070602